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Browsing by Author "Cardona-Safont, L."

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    Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors

    Rafi, J.M.
    ;
    Cardona-Safont, L.
    ;
    Zabala, M.
    ;
    Boulord, C.
    ;
    Campabadal, F.
    ;
    Pellegrini, G.
    ;
    Lozano, M.
    Proceedings paper
    2008, Gettering and Defect Engineering in Semiconductor Technology XII, 14/10/2007, p.431-436

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