Browsing by Author "Chanda, Kaushik"
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Publication Characterization of time-dependent variability using 32k transistor arrays in advanced HK/MG technology
Proceedings paper2015, IEEE International Reliability Physics Symposium - IRPS, 19/04/2015, p.3B.1Publication Maximizing reliable performance of CMOS applications–A comprehensive study of FPGA pass gates
; ; ; ; ;Toledano Luque, MariaProceedings paper2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.2D.4Publication Reliability and performance considerations for NMOSFET pass gates in FPGA applications
Proceedings paper2013, International Integrated Reliability Workshop - IIRW, 13/10/2013