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    Transient thermometry and HRTEM analysis of RRAM thermal dynamics during switching and failure

    Kwon, J.
    ;
    Sharma, A.A.
    ;
    Chen, C.
    ;
    Fantini, Andrea  
    ;
    Jurczak, Gosia  
    ;
    Bain, J.
    ;
    Picard, Y.
    Proceedings paper
    2016, 2016 IEEE International Reliability Physics Symposium (IRPS), 2/04/2016

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