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    Relaxation of time dependent NBTI variability and separation from RTN

    Weckx, Pieter  
    ;
    Kaczer, Ben  
    ;
    Chen, Christopher
    ;
    Raghavan, Praveen
    ;
    Linten, Dimitri  
    ;
    Mocuta, Anda
    Proceedings paper
    2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.XT-9.1-XT-9.5

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