Browsing by Author "Chen, Dapeng"
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Publication Physical mechanism underlying the time exponent shift in the ultra-fast NBTI of high-k/metal gated p-CMOSFETs
;Zhou, Longda ;Tang, Bo ;Yang, Ho; ;Li, Yongliang; ;Yin, HuaxiangZhu, HuilongProceedings paper2018, IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 16/07/2018, p.1-6