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Browsing by Author "Chen, Dapeng"

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    Physical mechanism underlying the time exponent shift in the ultra-fast NBTI of high-k/metal gated p-CMOSFETs

    Zhou, Longda
    ;
    Tang, Bo
    ;
    Yang, Ho
    ;
    Xu, Hao  
    ;
    Li, Yongliang
    ;
    Simoen, Eddy  
    ;
    Yin, Huaxiang
    ;
    Zhu, Huilong
    Proceedings paper
    2018, IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 16/07/2018, p.1-6

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