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Browsing by Author "Chramtsov, I."

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    Characterization and otimalization of 65nm CMOS technology using scanning spreading resistance microscopy

    Eyben, Pierre  
    ;
    De Keersgieter, An  
    ;
    Chramtsov, I.
    ;
    Fouchier, M.
    ;
    Janssens, Tom
    Meeting abstract
    2005, Proceedings of the 8th Int. Workshop on the Fabrication , Characterization and Modeling of Ultra Shallow Junctions in Semicond., 5/06/2005, p.55

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