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    Low-frequency noise in vertically stacked Si n-channel nanosheet FETs

    Oliveira, Alberto
    ;
    Veloso, Anabela  
    ;
    Claeys, Co
    ;
    Horiguchi, Naoto  
    ;
    Simoen, Eddy  
    Journal article
    2020, IEEE Electron Device Letters, (41) 3, p.317-320

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