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Browsing by Author "Colombi, Davide"

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    Publication

    A Comparative Study of In Situ Methodologies for Assessment of RF EMF Exposure From a 5G FR2 Base Station

    Goegebeur, Samuel  
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    Deprez, Kenneth  
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    Colombi, Davide
    ;
    Bischoff, Jens Eilers
    ;
    Di Paola, Carla
    Journal article
    2024, IEEE ACCESS, 12, p.132552-132564
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    Assessment of 5G NR base station RF-EMF exposure in a commercial network in Switzerland

    Aerts, Sam  
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    Deprez, Kenneth  
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    Colombi, Davide
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    Van den Bossche, Matthias 2  
    ;
    Verloock, Leen  
    Meeting abstract
    2021, Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association (BioEM 2021), 26-30 September 2021, p.17-22
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    Assessment of Human Exposure to Electromagnetic Fields: Review and Future Directions

    Hirata, Akimasa
    ;
    Diao, Yinliang
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    Onishi, Teruo
    ;
    Sasaki, Kensuke
    ;
    Ahn, Seungyoung
    Journal article review
    2021, IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, (63) 5, p.1619-1630
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    Design and validation of an in-situ measurement procedure for 5G NR base station RF-EMF exposure

    Aerts, Sam  
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    Verloock, Leen  
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    Van den Bossche, Matthias
    ;
    Colombi, Davide
    ;
    Martens, Luc  
    Proceedings paper
    2020-06, Joint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association (BioEM 2020), 21/06/2020, p.414-418
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    In Situ Assessment of 5G NR Massive MIMO Base Station Exposure in a Commercial Network in Bern, Switzerland

    Aerts, Sam  
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    Deprez, Kenneth  
    ;
    Colombi, Davide
    ;
    van den Bossche, Matthias
    ;
    Verloock, Leen  
    Journal article
    2021, APPLIED SCIENCES-BASEL, (11) 8, p.3592
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    In-situ measurement methodology for the assessment of 5G NR massive MIMO base station exposure at sub-6 GHz frequencies

    Aerts, Sam  
    ;
    Verloock, Leen  
    ;
    Van den Bossche, Matthias 2  
    ;
    Colombi, Davide
    ;
    Martens, Luc  
    Journal article
    2019, IEEE Access, 7, p.184658-184667

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