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Browsing by Author "Concannon, Ann"

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    HBM ESD robustness of GaN-on-Si Schottky diodes

    Chen, Shih-Hung  
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    Griffoni, Alessio
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    Srivastava, Puneet
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    Linten, Dimitri  
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    Thijs, Steven  
    Proceedings paper
    2011, 21st RCJ Reliability Symposium, 1/11/2011
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    HBM parameter extraction and transient safe operating area

    Linten, Dimitri  
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    Thijs, Steven  
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    Griffoni, Alessio
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    Scholz, Mirko
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    Chen, Shih-Hung  
    Proceedings paper
    2010-10, 32nd Annual EOS/ESD Symposium, 3/10/2010, p.425-432
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    Improving the of ESD self-protection capability of Integrated power NLDMOS arrays

    Vashchenko, V.
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    Strachan, A.
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    Linten, Dimitri  
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    Lafonteese, David
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    Concannon, Ann
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    Scholz, Mirko
    Proceedings paper
    2010, 32nd Annual EOS/ESD Symposium, 3/10/2010, p.293-299
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    Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester

    Scholz, Mirko
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    Chen, Shih-Hung  
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    Linten, Dimitri  
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    Johnsson, David
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    Gallerano, Antonio
    Proceedings paper
    2012, EOS/ESD Symposium, 9/09/2012
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    SCCF - System to component level correlation factor

    Thijs, Steven  
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    Scholz, Mirko
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    Linten, Dimitri  
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    Griffoni, Alessio
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    Russ, Christian
    Proceedings paper
    2010, 32nd Annual EOS/ESD Symposium, 3/10/2010, p.157-166

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