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Browsing by Author "Costantino, A."

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    Quantitive endurance failure model for filamentary RRAM

    Degraeve, Robin  
    ;
    Fantini, Andrea  
    ;
    Roussel, Philippe  
    ;
    Goux, Ludovic  
    ;
    Costantino, A.
    Proceedings paper
    2015, IEEE Symposium on VLSI Technology, 15/06/2015, p.188-189

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