imec Institutional Repository Browsing {{ collection }} by Author "Cron, Adam"

Publication

Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages

Cron, Adam

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Jiao, Hailong

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Marinissen, Erik Jan

Editorial material

2022, IEEE DESIGN & TEST, 39, 5

Publication

IEEE Standard 1838 Is on the Move

Cron, Adam

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Marinissen, Erik Jan

Journal article

2021, COMPUTER, (54) 11, p.88-94

Publication

IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers

Li, Yu

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Shao, Ming

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Jiao, Hailong

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Cron, Adam

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Bhatia, Sandeep

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Marinissen, Erik Jan

Proceedings paper

2018-05, IEEE European Test Symposium - ETS, 28/05/2018

Publication

IEEE Std P1838: 3D test access standard under development

Cron, Adam

;

Marinissen, Erik Jan

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Goel, Sandeep K.

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McLaurin, Teresa

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Bhatia, Sandeep

Book chapter

2019-03, Handbook of 3D Integration - Volume 4: 3D Design, Test, and Thermal Management

Publication

Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits

Marinissen, Erik Jan

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Cron, Adam

Oral presentation

2011, IEEE International Test Conference - ITC

Browsing by Author "Cron, Adam"