Browsing by Author "Cron, Adam"

Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages

IEEE Standard 1838 Is on the Move

IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers

IEEE Std P1838: 3D test access standard under development

Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits