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Browsing by Author "Czerwinsky, A."

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    Extended defect related excess low-frequency noise in Si junction diodes

    Simoen, Eddy  
    ;
    Vanhellemont, Jan
    ;
    Bosman, Gijs
    ;
    Czerwinsky, A.
    ;
    Claeys, Cor
    Proceedings paper
    1996, Defect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference, 3/12/1995, p.133-138

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