Browsing by Author "Davis, Jesse"
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Active Sampling of Electrical Characterization Parameters for Efficient Measurement
Proceedings paper2025, IEEE 37th International Conference on Microelectronic Test Structures (ICMTS), 2025-03-24, p.151-156Publication Machine Learning-Based Universal Threshold Voltage Extraction of Transistors Using Convolutional Neural Networks
Journal article2024, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, (37) 4, p.615-619Publication Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review
Journal article2025-APR 1, JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3, (24) 2, p.020901-1-020901-28