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Browsing by Author "Davydova, N."

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    Creative metrology development for EUVL: Flare and out-of-band qualification

    Lorusso, Gian  
    ;
    Hendrickx, Eric  
    ;
    Davydova, N.
    ;
    Peng, Y.
    ;
    Eurlings, M.
    ;
    Feenstra, K.
    ;
    Jiang, J.
    Oral presentation
    2011, 55th International conference on Electron, Ion and Photon Beam Technology and Nanofabrication - EIPBN
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    Impact of an etched EUV mask black border on imaging and overlay

    Davydova, N.
    ;
    de kruif, R.
    ;
    Fukugami, N.
    ;
    Kondo, S.
    ;
    Philipsen, Vicky  
    ;
    Van Setten, E.
    ;
    Connolly, B.
    Proceedings paper
    2012, Photomask Technology, 10/09/2012, p.852206

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