Browsing by Author "De Backer, Annick"
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Publication Chapter Eight - General conclusions and future perspectives
Publication Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images
Publication Chapter Four - Atom counting
Publication Chapter One - Introduction
Publication Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability
Publication Chapter Six - Atom column detection
Publication Chapter Three - Efficient fitting algorithm
Publication Chapter Two - Statistical parameter estimation theory: principles and simulation studies