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Browsing by Author "De Schrijver, Erik"

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    On the hot-carrier-induced post-stress interface trap generation in n-channel MOS transistors

    Bellens, Rudi
    ;
    De Schrijver, Erik
    ;
    Van den Bosch, Geert  
    ;
    Groeseneken, Guido  
    ;
    Heremans, Paul  
    Journal article
    1994, IEEE Transactions on Electron Devices, (41) 3, p.413-419

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