Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "De Wit, Pieter J.H."

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Emerging yield and reliability challenges in nanometer CMOS technologies

    Gielen, Georges  
    ;
    De Wit, Pieter J.H.
    ;
    Maricau, Elie
    ;
    Loeckx, J.
    ;
    Martin-Martinez, Jose
    ;
    Kaczer, Ben  
    Proceedings paper
    2008, Design Automation and Test in Europe Conference - DATE, 10/03/2008, p.1322-1327

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings