Browsing by Author "Delcorte, Arnaud"
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Publication Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Journal article2014, Surface and Interface Analysis, (46) S1, p.54-57Publication G-SIMS analysis of organic solar cell materials
Journal article2014, Surface and Interface Analysis, (46) S1, p.96-99Publication G-SIMS analysis of organic solar cell materials
Meeting abstract2013, 19th International Conference on Seconday Ion Mass Spectrometry, 29/09/2013Publication High quality profiles for inorganic material using Arn+ clusters: a must for hybrid system profiling and how to achieve them
Meeting abstract2015, SIMS XX, 13/09/2015Publication Influence of the film morphology and orientation on the depth profiling of perovskite layers
Oral presentation2016, SIMS EuropePublication Inorganic material profiling using Arn+ cluster: Can we achieve high-quality profiles?
Journal article2018-05, Applied Surface Science, 444, p.633-641Publication Large gas clusters for damageless molecular depth-profiling:
Oral presentation2016, 7ème Conférence Francophone sur les Spectroscopies d'Electrons - ELSPECPublication Matrix effects in doped Organic Light Emitting Diode (OLED) layers
Meeting abstract2017, 21st International Conference on Secondary Ion Mass Spectrometry - SIMS21, 10/09/2017, p.179Publication Sputtering with large On+ cluster projectiles on inorganic surfaces
Meeting abstract2015, SIMS XX, 13/09/2015Publication Understanding physico-chemical aspects in the depth profiling of polymer:fullerene layers
Journal article2016, Journal of Physical Chemistry C, (120) 49, p.28074-28082Publication VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS