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Browsing by Author "Della Marca, Vincenzo"

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    Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability

    Vandelli, Luca
    ;
    Arreghini, Antonio  
    ;
    Padovani, Andrea
    ;
    Larcher, Luca
    ;
    Van den Bosch, Geert  
    Proceedings paper
    2010, 48th Annual IEEE International Reliability Physics Symposium - IRPS, 2/05/2010, p.731-737

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