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Browsing by Author "Denis, S."

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    Towards a model for the electrical contact and the sample surface for scanning spreading resistance microscopy

    Eyben, Pierre  
    ;
    Denis, S.
    ;
    Clarysse, Trudo
    ;
    Alvarez, David
    ;
    Vandervorst, Wilfried  
    Meeting abstract
    2003, Ultra Shallow Junctions. 7th Int. Worksh. Fabrication, Characterization and Modeling of Ultra Shallow Doping Profiles in Semic., 27/04/2003, p.214

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