Browsing by Author "Dieudonné, F."
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Publication Shrinking from 0.25 μm down to 0.12 μm SOI CMOS technology node: a contribution to 1/f noise in partially depleted n-MOSFETs
;Dieudonné, F. ;Haendler, S. ;Jomaah, J. ;Raynaud, C.; ;van Meer, HansBalestra, F.Proceedings paper2002, Proceedings Ultimate Integration of Silicon (ULIS) Workshop, 7/03/2002, p.33-36