Browsing by Author "Djuric, Tatjana"
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Publication Defect detection in through silicon vias by GHz scanning acoustic microscopy: key ultrasonic characteristics
Proceedings paper2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.850-855Publication Failure and stress analysis of Cu TSVs using
Proceedings paper2015, 41st International Symposium for Testing and Failure Analysis - ISTFA, 1/11/2015, p.119-25