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Browsing by Author "Dress, Peter"

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    Effective EUVL mask cleaning technology solutions for mask manufacturing and in-fab mask maintenance

    Dietze, Uwe
    ;
    Dress, Peter
    ;
    Waehler, Tobias
    ;
    Singh, Sherjang
    ;
    Jonckheere, Rik  
    ;
    Baudemprez, Bart  
    Proceedings paper
    2011, 27th European Mask and Lithography Conference - EMLC, 18/01/2011, p.79850N
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    Integrated cleaning and handling automation of NXE3100 reticles

    Jonckheere, Rik  
    ;
    Waehler, Tobias
    ;
    Baudemprez, Bart  
    ;
    Dietze, Uwe
    ;
    Dress, Peter
    ;
    Brux, Oliver
    Proceedings paper
    2012, 28th European Mask and Lithography Conference, 17/01/2012, p.83520U
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    Minimizing particle contamination of NXE3100 reticles

    Jonckheere, Rik  
    ;
    Baudemprez, Bart  
    ;
    Waehler, Tobias
    ;
    Van Den Heuvel, Dieter  
    ;
    Schmalfuss, Heiko
    Oral presentation
    2012, International Symposium on Extreme Ultraviolet Lithography - EUVL

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