Browsing by Author "Du, A."
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Publication An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
;Zhou, L. ;Bo, T. ;Ji, Z. ;Yang, H. ;Xu, H. ;Liu, Q.; ;Wang, X. ;Ma, X. ;Li, Y. ;Yin, H.Du, A.Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 1, p.92-96