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Browsing by Author "Du, A."

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    An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

    Zhou, L.
    ;
    Bo, T.
    ;
    Ji, Z.
    ;
    Yang, H.
    ;
    Xu, H.
    ;
    Liu, Q.
    ;
    Simoen, Eddy  
    ;
    Wang, X.
    ;
    Ma, X.
    ;
    Li, Y.
    ;
    Yin, H.
    ;
    Du, A.
    Journal article
    2020, IEEE Transactions on Device and Materials Reliability, (20) 1, p.92-96

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