Browsing by Author "Duan, Guo Xing"
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Publication Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs
;Duan, Guo Xing ;Hachtel, Jordan ;Zhang, En Xia ;Zhang, Cher XuanFleetwood, DanielJournal article2016, IEEE Transactions on Device and Materials Reliability, (16) 4, p.541-548