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    Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

    Duan, Guo Xing
    ;
    Hachtel, Jordan
    ;
    Zhang, En Xia
    ;
    Zhang, Cher Xuan
    ;
    Fleetwood, Daniel
    Journal article
    2016, IEEE Transactions on Device and Materials Reliability, (16) 4, p.541-548

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