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Browsing by Author "Duschl, R."

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    Influence of stress-induced leakage current on reliability of HfSiOx

    Jakschik, S.
    ;
    Kauerauf, Thomas
    ;
    Degraeve, Robin  
    ;
    Hwang, Young Nam
    ;
    Duschl, R.
    ;
    Kerber, M.
    Journal article
    2007, IEEE Trans. Device and Materials Reliability, (7) 2, p.310-314

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