Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "El Amri, Safae Ben Ayad"

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    AI-enabled cross-domain image analysis for high-NA via defect quantification in random logic via arrays

    Cerbu, Dorin  
    ;
    Blanco, Victor  
    ;
    Poovana, , Bhavishya Chowrira
    ;
    El Amri, Safae Ben Ayad
    ;
    Hsia, Jeff
    Proceedings paper
    2026, Metrology, Inspection, and Process Control XL;, 2026-02-22, p.139811V

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings