Browsing by Author "Elst, Kathy"
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Publication Depth profiling with oxygen beams
Proceedings paper1994, Secondary Ion Mass Spectrometry - SIMS IX. Proceedings of the 9th International Conference, 7/11/1993, p.599-608Publication Depth Resolution and Ripple Formation on AlxGa 1-xAs
Oral presentation1995, 10th International Conference on Secondary Ion Mass Spectrometry (SIMS X); October 1-6, 1995; Münster, Germany.Publication In situ observation of compound formation and ion beam mixing
Proceedings paper1994, Secondary Ion Mass Spectrometry - SIMS IX. Proceedings of the 9th International Conference, 7/11/1993, p.746-749Publication Influence of the Composition of the Altered Layer on the Ripple Formation
Publication Model for ripple formation on Si under oxygen bombardment
Publication Operation of a Cameca IMS-4f at reduced extraction energies
Proceedings paper1994, Secondary Ion Mass Spectrometry - SIMS IX. Proceedings of the 9th International Conference, 7/11/1993, p.282-285Publication Positive ion yields under variable oxidation levels
Proceedings paper1997, Secondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference, 2/10/1995, p.203-206Publication Study of the altered layer formation under oxygen bombardment in combination with flooding
Proceedings paper1994, Secondary Ion Mass Spectrometry - SIMS IX. Proceedings of the 9th International Conference, 7/11/1993, p.617-620