Browsing by Author "Fadida, Sivan"

Band alignment of Hf–Zr oxides on Al2O3/GeO2/Ge stacks

Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors

Direct observation of both contact and remote oxygen scavenging of GeO2 in a metal-oxide-semiconductor stack

Effect of remote oxygen scavenging on electrical properties of Ge-based metal-oxide-semiconductor capacitors

Hf-based high-k dielectrics for p-Ge MOS gate stacks

Ti as a reactive gate electrode on high-k/p-Ge MOS capacitors