Browsing by Author "Fazan, P."
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Publication Constant-current study of dielectric breakdown of Pb(Zr,Ti)O-3 ferroelectric film capacitors
;Stolichnov, Igor ;Tagantsev, A. ;Setter, N. ;Okhonin, S. ;Fazan, P. ;Cross, J. S.Tsukada, M.Journal article2001, Integrated Ferroelectrics, (32) 1_4, p.45-54Publication FinFETs with Thermally Stable RMG Gate Stack for Future DRAM Peripheral Circuits
Proceedings paper2022, International Electron Devices Meeting (IEDM), DEC 03-07, 2022Publication Impact of channel engineering technology on HC performance of 100 nm MOSFETs
Proceedings paper2001, Proceedings of the 31st European Solid-State Device Research Conference, 11/09/2001, p.283-286Publication Transient effects in PD SOI MOSFETs and potential DRAM applications
;Okhonin, S. ;Nagoga, M. ;Sallese, J.-M. ;Fazan, P. ;Faynot, J. ;Pontcharra, J.Cristoloveanu, S.Journal article2002, Solid-State Electronics, (46) 11, p.1709-1713