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Browsing by Author "Freeland, C."

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    Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon

    Bernardini, S.
    ;
    Ishii, M.
    ;
    Whittaker, E.
    ;
    Hamilton, B.
    ;
    Freeland, C.
    ;
    Poolton, N.R.J.
    Journal article
    2007, Microelectronic Engineering, (84) 9_10, p.2286-2289

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