Browsing by Author "Freeland, C."
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Publication Nanoscale imaging and x-ray spectroscopy of electrically active defects in ultra thin dielectrics on silicon
;Bernardini, S. ;Ishii, M. ;Whittaker, E. ;Hamilton, B. ;Freeland, C.Poolton, N.R.J.Journal article2007, Microelectronic Engineering, (84) 9_10, p.2286-2289