Browsing by Author "Garros, X."

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A new method for quickly evaluating reversible and permanent components of the BTI degradation

Garros, X.
;
Subirats, Alexandre
;
Reimbold, G.
;
Gaillard, F.
;
Diouf, C.
;
Federspiel, X.
;
Huard, V.
Proceedings paper
2018, 2018 IEEE International Reliability Physics Symposium - IRPS, 11/03/2018, p.P-RT.6
Electrical modeling and simulation of nanoscale MOS devices with a high-permittivity dielectric gate stack

Autran, J.L.
;
Munteanu, D.
;
Houssa, Michel
;
Bescond, M.
;
Garros, X.
;
Leroux, C.
Proceedings paper
2004, Integration of Advanced Micro- and Nanoelectronic Devices - Critical Issues and Solutions, 12/04/2004, p.D6.1