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Browsing by Author "Gerritsma, A. M."

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    Suitability of Half-Wavelength Contact Acoustic Microscopy to detect deeply buried voids

    van Neer, P. L. M. J.
    ;
    van Willigen, D. M.
    ;
    Horchens, L.
    ;
    Gerritsma, A. M.
    ;
    Bogdanowicz, Janusz  
    Proceedings paper
    2025, 2025 Conference on Metrology Inspection and Process Control-Annual, 2025-02-24, p.134261M-1-134261M-4

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