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Browsing by Author "Gielen, E."

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    Surface characterization using TIRF microscopy

    Thoelen, R.
    ;
    Daenen, M.
    ;
    Williams, O.A.
    ;
    Vermeeren, V.
    ;
    Gielen, E.
    ;
    Hellings, N.
    ;
    Haenen, Ken  
    Oral presentation
    2005, Surface and Bulk Defects in CVD Diamond Films X

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