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Browsing by Author "Gleason, Reed"

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    Evaluation of TSV and micro-bump probing for wide I/O testing

    Smith, Ken
    ;
    Hanaway, Peter
    ;
    Jolley, Mike
    ;
    Gleason, Reed
    ;
    Strid, Eric
    ;
    Daenen, Tom  
    ;
    Dupas, Luc  
    Proceedings paper
    2011-09, IEEE International Test Conference - ITC, 20/09/2011

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