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Browsing by Author "Goes, Wolfang"

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    Publication

    Investigation of correlated trap sites in SILC, BTI and RTN in SiON and HKMG devices

    Bury, Erik  
    ;
    Degraeve, Robin  
    ;
    Cho, Moon Ju
    ;
    Kaczer, Ben  
    ;
    Goes, Wolfang
    ;
    Grasser, Tibor
    Meeting abstract
    2014, 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 30/05/2014

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