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Browsing by Author "Goto, T."

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    Radiation hardness of electrical properties of n-channel UTBOX SOI by 2 MeV electron irradiation

    Takakura, Kenichiro  
    ;
    Goto, T.
    ;
    Yoneoka, M.
    ;
    Tsunoda, I.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Oral presentation
    2015, 28th International Conference on Defects in Semiconductors - ICDS

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