Browsing by Author "Gramenova, Emilia"
Now showing 1 - 4 of 4
- Results per page
- Sort Options
Publication Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes
Journal article1999, J. Electrochem. Soc., (146) 1, p.359-363Publication Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes
Proceedings paper1997, Crystalline Defects and Contamination Control: Their Impact and Control in Device Manufacturing II, 31/08/1997, p.228-239Publication Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Oral presentation1996, International Conference on Extended Defects in Semiconductors - EDSPublication Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield