Browsing by Author "Grampeix, Helen"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach
Proceedings paper2015, International Conference on Frontiers of Characterization and Metrology for Nanoelectronics - FCMN, 14/04/2015, p.167-169