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Browsing by Author "Grampeix, Helen"

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    Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach

    Hoenicke, Philipp
    ;
    Detlefs, Blanka
    ;
    Fleischmann, Claudia  
    ;
    Vandervorst, Wilfried  
    Proceedings paper
    2015, International Conference on Frontiers of Characterization and Metrology for Nanoelectronics - FCMN, 14/04/2015, p.167-169

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