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Browsing by Author "Grasser, T"

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    Gate-stack engineered NBTI improvements in high-voltage logic-for-memory high-k/metal gate devices

    O'Sullivan, Barry  
    ;
    Ritzenthaler, Romain  
    ;
    Rzepa, G
    ;
    Wu, Zhicheng  
    ;
    Dentoni Litta, Eugenio  
    Proceedings paper
    2019, IEEE International Reliability Physics Symposium - IRPS, 31/03/2019, p.1-8

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