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Browsing by Author "Grund, Evan"

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    HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform

    Muhonen, Kathleen
    ;
    Ashton, Robert
    ;
    Smedes, Theo
    ;
    Scholz, Mirko
    ;
    Velghe, Rudolf
    Proceedings paper
    2012-09, EOS/ESD Symposium, 9/09/2012

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