Browsing by Author "Hartnagel, H. L."

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Characterisation of reliability of compound semiconductor devices using electrical pulses

Brandt, M.
;
Krozer, V.
;
Schuessler, M.
;
Bock, Karlheinz
;
Hartnagel, H. L.
Journal article
1996, Microelectronics and Reliability, 36, p.1891-1894
Pulsed stress reliability investigations of Schottky diodes and HBTs

Schuessler, M.
;
Krozer, V.
;
Bock, Karlheinz
;
Hartnagel, H. L.
Journal article
1996, Microelectronics and Reliability, 36, p.1907-1910