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Browsing by Author "Hasebe, T"

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    Design methodology of FinFET devices that meet IC-level HBM ESD targets

    Thijs, Steven  
    ;
    Russ, Christian
    ;
    Tremouilles, David
    ;
    Linten, Dimitri  
    ;
    Scholz, Mirko
    Proceedings paper
    2008-09, 30th Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD, 7/09/2008, p.295-303

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