Browsing by Author "Hasebe, Takumi"
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Publication Calibrated wafer-level HBM measurements for quasi-static and transient device analysis
Proceedings paper2007, EOS/ESD Symposium Proceedings, 16/09/2007, p.89-94Publication Calibration of very fast TLP transients
Proceedings paper2009-09, 31st Annual EOS/ESD Symposium, 30/08/2009, p.2B.4Publication ESD on-wafer characterization: Is TLP still the right measurement tool?
Journal article2009-10, IEEE Transactions on Instrumentation and Measurement, (58) 10, p.3418-3426Publication On-wafer human metal model – system-level ESD stress on component level
Proceedings paper2008-10, RCJ ESD Symposium, 30/10/2008Publication On-wafer human metal model measurements for system-level ESD analysis
Meeting abstract2009-09, 31st Annual EOS/ESD Symposium, 30/08/2009, p.5B.4Publication On-wafer human metal model measurements for system-level ESD analysis on component level
Proceedings paper2009-10, RCJ ESD Symposium, 20/10/2009Publication Self-protection capability of power arrays
Proceedings paper2009-09, 31st Annual EOS/ESD Symposium, 30/08/2009, p.5A.8Publication Voltage overshoot study in 20V DeMOS-SCR devices