Browsing by Author "Havelund, R."
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Publication Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Meeting abstract2013, 19th International Conference on Secondary Ion Mass Spectrometry, 29/09/2013Publication Inorganic material profiling using Arn + cluster: Can we achieve high Quality profiles?
Meeting abstract2013, SIMS19, 28/09/2013