Browsing by Author "Havelund, Rasmus"
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Publication Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument
Proceedings paper2018, SIMS Europe 2018, 16/09/2018Publication Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Journal article2014, Surface and Interface Analysis, (46) S1, p.54-57Publication G-SIMS analysis of organic solar cell materials
Meeting abstract2013, 19th International Conference on Seconday Ion Mass Spectrometry, 29/09/2013Publication G-SIMS analysis of organic solar cell materials
Journal article2014, Surface and Interface Analysis, (46) S1, p.96-99Publication High quality profiles for inorganic material using Arn+ clusters: a must for hybrid system profiling and how to achieve them
Meeting abstract2015, SIMS XX, 13/09/2015Publication Hybrid SIMS: How the orbitrap mass analyzer can improve the self-focusing SIMS concept for advanced semiconductor structures
Proceedings paper2019, FCMN 2019 - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2/04/2019Publication Inorganic material profiling using Arn+ cluster: Can we achieve high-quality profiles?
Journal article2018-05, Applied Surface Science, 444, p.633-641Publication Understanding physico-chemical aspects in the depth profiling of polymer:fullerene layers
Journal article2016, Journal of Physical Chemistry C, (120) 49, p.28074-28082