Browsing by Author "Hayashi, Y."

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Characterization of EM faults on ATmega328p

Beckers, Arthur
;
Balasch, J.
;
Gierlichs, B.
;
Verbauwhede, I.
;
Osuka, S.
;
Kinugawa, M.
;
Fujimoto, D.
Proceedings paper
2019, 2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic, 3/06/2019, p.1-4
Design and evaluation of a spark gap based EM-fault injection setup

Beckers, A.
;
Kinugawa, M.
;
Hayashi, Y.
;
Balasch, J.
;
Verbauwhede, I.
Proceedings paper
2020, 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 28/07/2020
EM information security threats against RO-based TRNGs: The frequency injection attack based on IEMI and EM information leakage

Osuka, S
;
Fujimoto, D.
;
Hayashi, Y.
;
Homma, N.
;
Beckers, A.
;
Balasch, J.
;
Gierlichs, B.
Journal article
2019, IEEE Transactions on Electromagnetic Compatibility, (1) 4, p.1122-1128