Browsing by Author "Hehenberger, P."
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Publication A rigorous study of measurement techniques for negative bias temperature instability
Journal article2008-09, IEEE Transactions on Device and Materials Reliability, (8) 3, p.526-536Publication Simultaneous extraction of recoverable and permanent components contributing to bias-temperature instability
Proceedings paper2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.801-804Publication Understanding negative bias temperature instability in the context of hole trapping
Journal article2009, Microelectronic Engineering, (86) 7_9, p.1876-1882