Browsing by Author "Higgs, V."
Now showing 1 - 3 of 3
- Results Per Page
- Sort Options
Publication Measurement, modelling and simulation of defects in as-grown Czrochalski silicon
Publication Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Oral presentation1996, International Conference on Extended Defects in Semiconductors - EDSPublication Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield