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Browsing by Author "Hirao, T."

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    A study on radiation damage of IGBTs 2-MeV electrons at different temperatures

    Nakabayashi, M.
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    Ohyama, H.
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    Hanano, N.
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    Kamiya, T.
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    Hirao, T.
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    Simoen, Eddy  
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    Claeys, Cor
    Proceedings paper
    2004, Proceedings 7th European Conference on Radiation and its Effects on Components and Systems, 15/09/2003, p.433-437
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    A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures

    Ohyama, H.
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    Claeys, Cor
    ;
    Nakabayashi, H.
    ;
    Masakazu, T.
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    Simoen, Eddy  
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    Hanano, M.
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    Naotika, F.
    Oral presentation
    2003, 7th European Conference on Radiation and Its Effects on Components and Systems - RADECS
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    A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures

    Nakabayashi, M.
    ;
    Ohyama, H.
    ;
    Hanano, N.
    ;
    Kamiya, T.
    ;
    Hirao, T.
    ;
    Takakura, K.
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    Simoen, Eddy  
    Journal article
    2004, Nuclear Instruments & Methods in Physics Research B, 219-220, p.676-679
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    Effects of electron irradiation on IGBT devices

    Ohyama, H.
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    Takakura, K.
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    Nakabayashi, M.
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    Hirao, T.
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    Onoda, S.
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    Kamiya, T.
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    Simoen, Eddy  
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    Claeys, Cor
    Oral presentation
    2003, 16th International Conference on Ion Beam Analysis - IBA
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    Effects of high-temperature gamma ray irradiation on npn Si transistors

    Ohyama, Hidenori
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    Hirao, T.
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    Simoen, Eddy  
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    Claeys, C.
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    Fukushima, Y.
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    Tanigawa, A.
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    Onoda, S.
    Oral presentation
    2001, RADECS; 10-14 September 2001; Grenoble, France.
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    High temperature electron irradiation effects in InGaAs photodiodes

    Ohyama, H.
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    Takakura, K.
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    Hayama, K.
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    Hirao, T.
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    Onoda, S.
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    Simoen, Eddy  
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    Claeys, Cor
    Proceedings paper
    2004, Gettering and Defect Engineering in Semiconductor Technology - GADEST 2003, 21/09/2003, p.381-386
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    High temperature electron irradiation effects in InGaAs photodiodes

    Ohyama, H.
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    Takakura, K.
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    Hayama, K.
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    Hirao, T.
    ;
    Onoda, S.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Oral presentation
    2003, Gettering and Defect Engineering in Semiconductor Technology - GADEST
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    Impact of lattice defects on the performance degradation of Si photodiodes by high-temperature gamma and electron irradiation

    Ohyama, Hidenori
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    Hirao, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, C.
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    Onoda, S.
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    Takami, Y.
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    Itoh, H.
    Journal article
    2001, Physica B, 308, p.1226-1229
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    Induced lattice defects in InGaAsP laser diodes by high-temperature gamma ray irradiation

    Ohyama, Hidenori
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    Hirao, T.
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    Simoen, Eddy  
    ;
    Claeys, C.
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    Onoda, S.
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    Takami, Y.
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    Itoh, H.
    Journal article
    2001, Physica B, 308, p.1185-1188
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    Radiation damage in npn Si transistors due to high-temperature gamma-ray and 1-MeV electron irradiation

    Ohyama, Hidenori
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    Hirao, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Nakabayashi, M.
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    Onoda, S.
    Proceedings paper
    2002, GADEST 2001 - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology;, p.465-470
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    Radiation damage of InGaAsP laser diodes by high-temperature gamma ray and electron irradiation

    Ohyama, Hidenori
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    Hirao, T.
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    Simoen, Eddy  
    ;
    Claeys, C.
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    Kudou, T.
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    Onoda, S.
    Proceedings paper
    2001, Proceedings of the 31st European Solid-State Device Research Conference, 11/09/2001, p.325-354
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    Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation

    Ohyama, Hidenori
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    Nakabayashi, M.
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    Simoen, Eddy  
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    Claeys, Cor
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    Tanaka, T.
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    Hirao, T.
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    Onada, S.
    Journal article
    2001, Microelectronics Reliability, (41) 9_10, p.1443-1448
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    Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation

    Ohyama, Hidenori
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    Nakabayashi, M.
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    Simoen, Eddy  
    ;
    Claeys, C.
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    Tanaka, T.
    ;
    Hirao, T.
    ;
    Onada, S.
    Oral presentation
    2001, Proceedings of the 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF;
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    Study of electron-irradiated IGBTs by the DCIV method and lifetime

    Nakabayashi, M.
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    Ohyama, H.
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    Nanao, N.
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    Hirao, T.
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    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2004, Proceedings International Conference on Electrical Engineering, p.632-635
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    The degradation of the electrical properties of IGBTS by 2-MeV electron irradiation and high-temperature

    Nakabayashi, M.
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    Ohyama, H.
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    Hanano, N.
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    Hirao, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Proceedings paper
    2004, Proceedings International Workshop on Radiation Effects in Semiconductor Devices for Space Applications, p.183-186

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